Synopsys QuickCap NX is a 3D parasitic capacitance field solver intended for use as a high-accuracy reference for parasitic extraction at advanced semiconductor process nodes. It is used in foundry process technology development, PDK quality improvement, and cell/IP characterization where higher-fidelity 3D modeling (compared with rule-based extractors) is required. The tool provides extraction of self, coupling, and distributed capacitance using a random-walk algorithm and includes a 3D visualization capability for modeled process stacks.
Key vendor-stated use areas include:
- Early process node exploration and parasitic model development
- Reference / calibration for rule-based extractors
- Standard cell characterization and memory/SRAM characterization
- Improving PDK quality and modeling advanced process effects (e.g., non-Manhattan geometries, conformal dielectrics, floating metal)